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MIL-HDBK-217F TABLE OF CONTENTS SECTiON 1: SCOPE H -i DnrnAFfi 1_1 1 . I I UI puoc ' I 1.2 Aoolication 1-1 -i r 1.3 Computerized Reliability Prediction 1-1 SECTiON 2: REFERENCE DOCUMENTS 2-1 SECTION 3: INTRODUCTION 3.1 Reliability Engineering 3-1 3.2 The Role of Reliability Prediction 3-1 3.3 Limitations of Reliability Predictions 3-2 n A DMI4 AmaI.M'IA n o o.h rail guedd ncuiuiiun SECTION 4: RELIABILITY ANALYSIS EVALUATION 4-1 SECTION 5: MICROCIRCUITS, INTRODUCTION 5-1 5.1 G&te/LoQic Arrays and Microprocessors 5-3 5.2 Memories 5-4 5.3 VHSIC/VHSIC Like 5-7 5.4 GaAs MMIC and Digital Devices 5-8 5.5 Hybrids 5-9 5.6 SAW Devices 5-10 7 Mannotir ihhla Memoriae .11 ^ . I ITIU^I I^IIIU WUWUIV h/ I I 5.8 n-r Table for All 5-13 i 5.9 Table for All 5-14 e 4 4 T /am iJ..1 c i ij ufuiciiMiHcuiuu, (mi nyunua; o-i / 5.12 Tj Determination, (For Hybrids) 5-18 5.13 Examples 5-20 eprnrtM nicrocTi: ccuirnwnnrmDC WkiW I W l Vi IW lib I to Wlalll I W W I 1WV I W I 1W 6.0 Discrete Semiconductors. Introduction 6-1 6.1 Diodes, Low Frequency 6-2 6.2 Diodes, High Frequency (Microwave, RF) 6-4 6.3 Transistors, Low Frequency, Bipolar 6-6 A TraneiciAre I ftiu Crnm lanmj Ci CCT C.Q w.-t , imi^iotwig, k>v*i i ic^uoi J, u I u~u 6.5 Transistors. Unijunction 6-9 6.6 Transistors, Low Noise, High Frequency, Bipolar 6-10 6.7 Transistors, High Power, High Frequency, Bipolar 6-12 6.8 Transistors, High Frequency, GaAs FET 6-14 c ft ui.k r- o: PPT 4/. o. 1 iauaiui&, niyn nequeiiuy, oi rc 1 o- 1 O 6.10 Thyristors and SCRs 6-17 6.11 Optoelectronics, Detectors. Isolators. Emitters 6-19 6.12 Optoelectronics, Alphanumeric Displays 6-20 6.13 Optoelectronics, Laser Diode 6-21 6.14 Tj Determination 6-23 6.15 Example 6-25

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