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MIL-STD-105E CONTENTS Page Paragraph 1. SCOPE 1 1.1 Purpose 1 1.2 Application 1 2. REFERENCED DOCUMENTS 1 2.1 Not applicable 1 3. DEFINITIONS 1 3.1 Acceptable Quality Level (AQL) 2 3.2 Average Outgoing Quality (AOQ) 2 3.3 Average Outgoing Quality Limit (AOQL) 2 3.4 Classification of Defects 2 3.5 Critical Defect 2 3.6 Critical Defective 2 3.7 Defect 2 3.8 Defective 3 3.9 Defects Per Hundred Units 3 3.10 Inspection 3 3.11 Inspection by Attributes 3 3.12 Lot or Batch 3 3.13 Lot or Batch Si2e 3 3.14 Major Defect 3 3.15 Major Defective 3 3.16 Minor Defect 3 3.17 Minor Defective 3 3.18 Percent Defective ' 4 3.19 Process Average 4 3.20 Sample -4 3.21 Sample Size Code Letter 4 3.22 Sampling Plan 4 3.23 Unit of Product 4 4. GENERAL REQUIREMENTS 4 4.1 Written Procedures 4 4.2 Nonconformance 4 4.3 Formation and Identification of Lots or Batches... 5 4.4 AQL 5 4.4.1 AQL Use 5 4.4.2 Limitation 5 4.4.3 Choosing AQLs 5 iv 4 Source: http://www.assistdocs.com -- Downloaded: 2013-02-17T01:46Z Check the source to verify that this is the current version before use.

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