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ANALYSIS - TOPIC A10 I Topic A11: Reliability Adjustment Factors "What if" questions are often asked regarding reliability figures of merit. For a rapid translation, tables for different quality levels, various environments and temperatures are presented to make estimates of the effects of the various changes. The data base for these tables is a grouping of approximately 18000 parts from a number of equipment reliability predictions performed in-house on military contracts. The ratios were developed using this data base and MIL-HDBK-217F algorithms. The relative percentages of the part data base are shown as follows: 5% 3% 2% 17% 28% 18% Transistors n Capacitors 13 Resistors Integrated Circuits m Inductors b Diodes IQ Miscellaneous 27% Table A11-1: Part Quality Factors (Multiply MTBF by) To Quality Class Space Full Military Ruggedized Commercial Space From Full Military Quality Ruggedized Class Commercial X 0.8 0.5 0.2 Space From Full Military Quality Ruggedized Class Commercial 1.3 X 0.6 0.2 Space From Full Military Quality Ruggedized Class Commercial 2.1 1.6 X 0.4 Space From Full Military Quality Ruggedized Class Commercial 5.3 4.1 2.5 X IC Semiconductor Passive Part Class S Class B Class B-1 Class D IC Semiconductor Passive Part JANTXV JANTX JAN NONMIL IC Semiconductor Passive Part ER(S) ER(R) ER(M) NONMIL CAUTION: Do not apply to Mean-Time-Between-Critical-Failure (MTBCF). ROME LABORATORY RELIABILITY ENGINEER'S TOOLKIT 105

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