Rome Laboratory Reliability Engineers Toolkit 1993

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ANALYSIS - TOPIC A10 Microcircuit Quality Factors (cont'd): nQ Calculation for Custom Screening Programs Group MIL-STD-883 Screen/Test (Note 3) Point Valuation 1* TM 1010 (Temperature Cycle, Cond B Minimum) and TM 2001 (Constant Acceleration, Cond B Minimum) and TM 5004 (or 5008 for Hybrids) (Final Electricals @ Temp Extremes) and TM 1014 (Seal Test, Cond A, B, or C) and TM 2009 (External Visual) 50 2* TM 1010 (Temperature Cycle, Cond B Minimum) or TM 2001 (Constant Acceleration, Cond B Minimum) TM 5004 (or 5008 for Hybrids) (Final Electricals @ Temp Extremes) and TM 1014 (Seal Test, Cond A, B, or C) and TM 2009 (External Visual) 37 3 Pre-Burn in Electricals TM 1015 (Burn-in B-Level/S-Level) and TM 5004 (or 5008 for Hybrids) (Post Burn-in Electricals @ Temp Extremes) 30 (B Level) 36 (S Level) 4* 5 6 T 8 9 10 11 TM 2020 Pind (Particle Impact Noise Detection) TM 5004 (or 5008 for Hybrids) (Final Electricals @ Temperature Extremes) TM 2010/17 (Internal Visual) TM 1014 (Seal Test, Cond A, B, or C) TM 2012 (Radiography) TM 2009 (External Visual) TM 5007/5013 (GaAs) (Wafer Acceptance) TM 2023 (Non-Destructive Bond Pull) 11 11 (Note 1) 7 7 (Note 2) 7 7 (Note 2) 1 1 87 7C 2 + 1 Q ~ Point Valuations NOT APPROPRIATE FOR PLASTIC PARTS NOTES: 1. Point valuation only assigned if used independent of Groups 1, 2 or 3. 2. Point valuation only assigned if used independent of Groups 1 or 2. 3. Sequencing of tests within groups 1, 2 and 3 must be followed. 4. TM refers to the MIL-STD-883 Test Method. 5. Nonhermetic parts should be used only in controlled environments (i.e., Gg and other temperature/humidity controlled environments). EXAMPLES: 87 1. Mfg. performs Group 1 test and Class B bum-in: 7Cq = 2 + = 3.1 87 2. Mfg. performs internal visual test, seal test and final electrical test: juq - 2 + ^ - 5.5 Other Commercial or Unknown Screening Levels "Q-10 96 ROME LABORATORY RELIABILITY ENGINEER'S TOOLKIT

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